Li Xiaomin, Chairman of Wintech Nano, held a Bachelor's degree from Peking University and a Master's degree from National University of Singapore. He has applied for numerous invention patents and published over 100 papers and co-authored two books. In 2001, Li Xiaomin worked at the Agency for Science, Technology and Research (A*STAR) in Singapore. In 2004, he founded WinTech Nano-Technology Services Pte. Ltd. in Singapore, and in 2012, he established Wintech Nano (Suzhou) Co., Ltd. Under his leadership, the company has become a renowned platform for semiconductor chip analysis and testing services, as well as a crucial support center for R&D in the industry. Li Xiaomin introduced the innovative "Labless" concept, which involves outsourcing the "necessary but non-core" R&D segments from the industry, creating a new independent sector.

Zeng Yi, Research Fellow, Doctoral Supervisor, Director of the Testing Center at the Shanghai Institute of Ceramics, Chinese Academy of Sciences (SICCAS), Director of the Industrial Technology Basic Public Service Platform for Advanced Inorganic Materials Science and Engineering of the Ministry of Industry and Information Technology, and Director of the Shanghai Quality Inspection Center for Key Ceramic Materials and Devices. Mainly engaged in researches related to scanning electron microscopes (SEMs), he serves as the Chief Scientist of the Instrument Development Special Project under the National Key R&D Program and has undertaken a number of national and local scientific research projects as the person in charge, including the Materials Genome Special Project of the National Key R&D Program, the 863 Program, international cooperation projects of the Ministry of Science and Technology, and Shanghai Science and Technology Support Program. He has published more than 100 SCI papers as the first author or corresponding author. He also holds positions such as Standing Director of the Chinese Electron Microscopy Society, Deputy Director of the Scanning Electron Microscope Professional Committee of the Chinese Society for Electron Microscopy, and Vice President of the Shanghai Society for Microscopy.

Dr. YUNYU WANG, Founder and Chairman of the Board of Xiamen Yunmao Technology Co., Ltd., holds a bachelor's degree from Nankai University, a Master's and a PhD in Physics from North Carolina State University, and conducted postdoctoral research at the University of Texas at Austin, specializing in the growth, characterization, and application of nanomaterials. He has published over 30 SCI papers (with citations exceeding 1,000) and holds 11 international patents. With over 20 years of experience in high-end equipment product and process development, he previously the developed products such as HDPCVD and Selective Etch etc.

Linhua Zhang, majored in Electronic Information Engineering, previously working in the Laboratory of Changjiang Electronics Technology Co., Ltd. and Integrated Service Technology Co., Ltd., was responsible for comprehensive analysis experiments at the package level and chip level. He has more than ten years's experience in laboratory management and application. Currently, he holds the position of Technical Deputy Director of Comprehensive Analysis Department at Wintech Nano (Suzhou) Co., Ltd., where his responsibilities include, but not limited to, providing technical support for failure analysis of semiconductor devices such as integrated circuit (IC) chips, optical devices, discrete devices, and MEMS, as well as tackling experimental difficulties. He leads multiple key technical research projects for major clients and assists in advancing the R&D progress of clients' new products. During his service, he has participated in and led the drafting and filing of multiple patents, represented by A Localization Method and Device for 3D Stacked Packaging Devices Failure and A Failure Analysis Method for High-Level Chips. He has also published multiple papers at various international conferences, such as Studies and Application of Failure Analysis Technology for Semiconductor Advanced Processes.

Michael Rauscher serves as Senior Product Director for Focused Ion Beam (FIB) Product Line at Thermo Fisher Scientific. He holds a PhD in Ion Beam Physics and has previously held positions in market strategy and product lifecycle management at internationally renowned instrumentation and semiconductor companies, with over 20 years of experience in product management. Pierre-Yves Guittet is Product Director for Transmission Electron Microscopes (TEM) at Thermo Fisher Scientific and has previously responsible for Overlay applications and product marketing at ASML and Nanometrics

Biography of the Speaker：Dr. Hua received a Ph.D. degree in Physics from National University of Singapore in 1994. After that he worked in Chartered Semiconductor (Globalfoundries), which is a major international wafer fab, and served as Director of Failure Analysis Lab in 1995--2013. In 2014, he joined Wintech-Nano (Singapore) as Vice President/COO. He is an expert in semiconductor wafer fab, process and device failure analysis. He has published more than 400 papers/patents. He has deep academic attainments in the field of wafer fab, packaging and failure analysis, especially in the front-end process of wafer fab, research and development of GOI failure analysis methods and the advanced fab process of anti-pollution and corrosion on Al Bondpads in the back-end wafer fab process with the international leading level. Dr Hua is also actively engaged in and caring about education, and is assigned as a member of the Educational Advisory Committee in National University of Singapore and a PhD Supervisor at National University of Singapore/Nanyang Technological University /Singapore University of Technology and Design / Singapore Economic Development Board / Wintech-Nano (IPP). He also actively participated in the establishment of the Wintech-Nano Semiconductor Institute (WTSI) and served as a Senior Fellow in cooperating with the Singapore University of Technology and Design (SUTD) to jointly train master students in IC design, failure analysis and reliability analysis.

Biography of the Speaker：Sarah Ma obtained his Ph.D. in Material Science and Engineering in 2012 from Shanghai Jiaotong University, where she worked on development and characterization of high strength and ductile magnesium alloys. She then completed her postdoctoral work at National Institute of Material Science (NIMS, Japan) and there her major research was characterization of magnesium and magnetic material using HAADF-STEM and 3DAP. After joining in Oxford Instrument as application scientist in 2016, she mainly focuses on application support of Imaging and Material Analysis.

Biography of the Speaker：English: Mr. Zhou Ou graduated from Shanghai Jiaotong University. During the master period, he was engaged in the research of transmission electron microscope and semiconductor materials. After graduation, he joined Shanghai Grace Semiconductor, worked in failure analysis lab for many years, and accumulated plenty of application experience of various electron microscope in the semiconductor field. Then he worked in European and American instrument companies for many years, further expanding the understanding of electron microscope application in many industries. Now he is the vice general manager of marketing department of Hitachi High-Tech Scientific Solutions (Beijing) Co. Ltd, mainly responsible for the promotion and technical support of electron microscope series products in the semiconductor industry.

Biography of the Speaker：Fenghao Zhong, Director, Deputy General Manager, and Senior Engineer of Hangzhou Changchuan Technology Co., Ltd. He has focused on the R&D of integrated circuit (IC) testing equipment for nearly 30 years and is a first-class senior technical expert in the field of IC testing equipment. He also serves as the Leader of the compilation group of Chiplet Testing Standard and an Expert Member of China's National Integrated Circuit Standardization Technical Committee (TC599). He has applied for more than 80 patents related to IC testing technology and published 5 professional papers

Biography of the Speaker：ZhengYiming, Zeiss application manager, he has extensive experience in the semiconductor solutions sector, specializing in the application support of advanced technologies such as Scanning Electron Microscopy (SEM) and Focused Ion Beam (FIB). He is dedicated to delivering key technical solutions for semiconductor materials characterization and failure analysis.

Abstract of Speech：Currently serving as a failure analysis application engineer, responsible for application training, pre-sales demonstration testing, and post-sales technical support of Hamamatsu's failure localization technologies, providing professional solutions to clients. Previously served as Hamamatsu Stealth Dicing Engine (SDE) after-sales maintenance engineer for China region, acting as the national technical liaison to lead debugging and maintenance of Hamamatsu's optical systems in DISCO stealth dicing equipment, with extensive experience in laser optical processing applications and stealth dicing technical support.